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I'm well on my way to fully completing these milestones. I know the basic features of the Nanoscope program and I have set up the AFM twice. The best way to learn these milestones is by actually going through the works- you remember the steps much better when you perform these milestones compared to just reading about it. I wish I had set up the AFM a little sooner. However, when I feel completely comfortable with setting up the AFM, I will be tested by a Notre Dame professor on how well I can use it.


 * Explain the necessary steps to set-up the AFM and insert a sample.**
 * 1) First, as with all electronics, you need to turn the machine on (that's attached to AFM and computer). Start up the computer.
 * 2) Insert a tip into the cantilever holder, and place the sample (which should be placed on a piece of tape on a magnet) into the AFM opening using clean tweezers, located near the top of the AFM.
 * 3) Place the tip holder into the AFM sample holder by flipping it over and inserting it into the opening, making sure not to drag it on the base of the opening or sample.
 * 4) Next, make sure the AFM is on the desired mode: contact, tapping, non-contact, etc.
 * 5) After this, focus on the sample tip, using the large knobs on the micrscope and viewing the sample on TV monitor connected to the AFM.
 * 6) Next, adjust the laser so that the feedback is maximized -this can be told from the screen near the bottom of the microscope; the better the feedback, the greater the signal viewed (there's a dial showing the signal strength).
 * 7) After this, bring the sample into focus, by using the big knobs near the top of the microscope. Once the sample surface is in focus, bring the tip to the sample level by pressing the "down" switch once. Make sure that the spot chosen for scanning doesn't have any ostensible debris- you'll have trouble scanning it. Instead, chose a spot that looks clear. This is done using the x and y plane knobs at the bottom of the AFM.
 * 8) Next, tune the tip using the tuning feature on the Nanoscope program. Once that is completed (if the tip is defected, change the tip), start the computer approach towards the sample by pressing the "approach" button. The computer will automatically start a scan.
 * 9) Once you are done, after capturing an image, say, then press the "up" button. Remove the cantilever holder, the sample, and turn off the machines. Clean up.

The Nanoscope program allows you to analyze the sample surface. With it, you can obtain cross-sectional and 3-D images. You can assess the various heights of the sample and can zoom in or out of certain surface areas.
 * Describe some of the feautres of the Nanoscope(III) program. Explain the necessary steps to obtain an image and save it.**

To obtain an image, proceed with the steps noted above regarding setting up the AFM. Before the AFM starts producing an image that appears on the computer screen, adjust the sample size, the voltage, and the maximum height, as well as any other limitations, as desired. Next, "play around" with the voltage, meaning that you should make subtle changes to see which voltage yields the clearest image. As you watch the development of the image, if too many interruptions have appeared on the screen, start the image again going from top to bottom or vice versa. Next, once you are satisfied with the way the image is turning out, capture the image using the "capture" button at the top of the screen. This must be done before AFM has completed the scan of the surface. Save the image by changing the filename, if desired.

Once you have your image, you can zoom into a portion or move to a different location. To zoom in, click the "zoom in" feature and adjust the size of your new image (you can select the area you want). The AFM will start, once you hit "execute". If the area you selected is not an "easy" number, such as 2.67 micrometers, adjust the scan size to either 2.5 or 3 micrometers by typing it into the scanning size box. This, however, is not necessary.

To view a different portion of the sample, go to the AFM and push the "up" button once. This will lower the sample so that the tip doesn't scratch the surface as the sample is being moved. Using the x and y plane adjustments, move to a different portion of the sample. Next, allow the computer to approach the surface, and start the scanning process over again.

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